Testing Interconnects of Dynamic Reconfigurable FPGAs

Field Programmable Gate Arrays (FPGAs) are an increasingly popular choice for fast prototyping and for products whose time to market is relatively short. Testing FPGAs before programming them is thus becoming a major concern to the manufacturers as well as the users. In this paper we propose a universal test for the interconnects of typical dynamic reconfigurable FPGAs. The proposed test configurations and corresponding test patterns for the Xilinx XC6200 FPGAs are shown to cover all interconnect faults. In our test, the total number of test configurations is only 7, which is independent of the FPGA size. The test time for XC6216 is less than 5ms.